Re: test (was: [f-cpu] No latches, please !)

[Yann Guidon <whygee@f-cpu.org>]

hi !

Juergen Goeritz wrote:
> 
> Hi guys,
> 
> very, very intersting discussion.
my feeling, too :-)

> Let me add another thing:
> 
> The test strategy of a device is very important. But also
> very important is WHEN you are able to start a test. The
> computer world is moving to cluster designs. It may be a
> very good idea to implement a test strategy that can be
> activated anytime! I.e. my suggestion is to make selftest
> a part of the normal operation of the device that can be
> activated by software!

so this boils down to be able to trigger a "hard reset" with SW.
that's pretty easy to do, no ?

> JG
WHYGEE
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